Sun 6 Aug 2006
In one of my CMOS IC design classes, I spent almost a third of a semester looking at the various causes of latch-up and what preventative measures can be taken to avoid this nasty phenomenon. After having spent so much time (and money on a book) I was pleased to see this application note from TI: Latch-Up, ESD, and Other Phenomena by Eilhard Haseloff.
( slya014a.pdf )
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